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Authors :
Chinzei K; Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan.; Ikeda TN
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Source:
Physical review letters [Phys Rev Lett] 2020 Aug 07; Vol. 125 (6), pp. 060601.Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print Cited Medium: Internet ISSN:
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Authors :
Wu HC; Department of Materials Engineering, Ming Chi University of Technology, New Taipei 24301, Taiwan. .; Chen HH
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Source:
Materials (Basel, Switzerland) [Materials (Basel)] 2016 Aug 01; Vol. 9 (8). Date of Electronic Publication: 2016 Aug 01.Publisher: MDPI Country of Publication: Switzerland NLM ID: 101555929 Publication Model: Electronic Cited Medium: Print ISSN: 1996-1944 (Print)
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Source:
Physical review letters [Phys Rev Lett] 2016 May 06; Vol. 116 (18), pp. 189901. Date of Electronic Publication: 2016 May 02.Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print-Electronic Cited Medium: Internet
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Source:
School Library Journal. 2005, Vol. 51, Issue 11, pages. 2
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Authors :
Hickey C; Department of Physics, University of Toronto, Toronto, Ontario M5S 1A7, Canada.; Cincio L
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Source:
Physical review letters [Phys Rev Lett] 2016 Apr 01; Vol. 116 (13), pp. 137202. Date of Electronic Publication: 2016 Apr 01.Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print-Electronic Cited Medium: Internet
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Source:
School Library Journal. 2011, Vol. 57, Issue 3, pages. 1
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Source:
School Library Journal. 2009, Vol. 55, Issue 4, pages. 1
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