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Periodical

Avoiding the Perils of Imaging System Implementations.

  • Source: Information Management Journal. 2000, Vol. 34, Issue 4, pages. 4

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Academic Journal

Annealing studies of PbTe and Pb1-xSnxTe.

  • Source: Journal of Applied Physics; Mar1973, Vol. 44 Issue 3, p1327-1332, 6p

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Conference

500V BiMOS technology and its applications.

  • Source: 1985 IEEE Power Electronics Specialists Conference; 1985, p37-41, 5p

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Academic Journal

Second Breakdown in Power Transistors Due to Avalanche Injection.

  • Source: IEEE Transactions on Industrial Electronics & Control Instrumentation; 1977, Vol. IECI-24 Issue 4, p306-312, 7p

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Academic Journal

Sensitivity of Marginal Oscillator Spectrometers.

  • Source: Review of Scientific Instruments; May1971, Vol. 42 Issue 5, p704-712, 9p

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  • 1-10 of  34 results for ""Adler, Michael S.""