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Conference

Ion Beam Analysis Of Silicon-Based Surfaces And Correlation With Surface Energy Measurements.

Subjects: SURFACE analysis; SILICON; ION bombardment

  • Source: AIP Conference Proceedings; 6/1/2011, Vol. 1336 Issue 1, p201-207, 7p, 1 Black and White Photograph, 2 Charts, 3 Graphs

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  • 1-1 of  1 results for "Lewis, C. S. (Clive Staples), 1898-1963"